Atsushi Masuda of Collaborative Research Team and Kohjiro Hara of Collaborative Module-Reliability Research Team, the Research Center for Photovoltaic Technologies (RCPVT) of the National Institute of Advanced Industrial Science and Technology (AIST), have developed a technology that suppresses output decline in crystalline silicon solar cells caused by potential-induced degradation (PID), by coating the glass substrate with a thin film of titanium oxide-based composite metal compound, in collaboration with Sustainable Titania Technology Inc. (STi).

The technology puts a thin-film coating of titanium oxide-based composite metal compound on the glass substrate used in photovoltaic modules. This suppresses the diffusion of sodium ions, etc. from the glass substrate that is considered the major cause of PID. The developed technology is expected to further enhance the reliability of crystalline silicon photovoltaic modules and help enhance the long-term reliability of mega solar and other solar power generation systems, installation of which is expected to accelerate in the near future.