Nikon's new touch probe technology 联合网

Nikon's new touch probe technology

Post Date: 10 Apr 2009 Viewed: 850

Nikon Instruments has expanded the capabilities of its iNEXIV measurement systems with the incorporation of the Renishaw TP20 and TP200 touch-trigger probes. Specifically designed for the new model iNEXIV VMA-2520, the TP20 and TP200 allow system users the option to incorporate touch-probe technology into 3-D workpiece measurements.

The touch probes are available pre-installed as an integral part of the iNEXIV measuring system, or as an optional accessory that can be installed later, providing the flexibility to configure a measuring system to fit their specific needs. Nikon says that the addition of the touch probe technology creates more accurate datum planes, resulting in improved measurement and repeatability accuracies on side wall and prismatic 3D parts. The iNEXIV can also perform touch probe, laser and vision measurements on the same workpiece. The flexibility also allows users to grow their system as their imaging needs grow.

The iNEXIV is specifically designed for measuring 3-D workpieces and already incorporates vision and laser sensing capabilities. It offers a 200 mm Z-axis measuring range with an optical system featuring a long 73.5 mm working distance. Additionally, the image processing software offers extended depth of field for 3-D imaging and accurate 2-D stitched panoramic images. The 10 x optical zoom system has an ultra low distortion of less than 0.1% and features an Apochromatic Objective Lens with a high Numerical Aperture NA (0.11).