ABSTRACT: Adhesion measurement is one of the key question for the fabrication and application of CVD diamond thin

film. In this paper, some typical adhesion measurements on diamond thin films were introduced. And also, the research status and the development direction of adhesion measurements were discussed. A novel bulge-blister was put forward for the adhesion measurement of diamiond thin films deposited on complex-geometries substrate, which can give a foundation for the optimization of fabrication technics and a criterion  for the eValuation on the quality of diamond thin films.

KEYWORDS: diamond thin film  adhesion strength   blister test